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Tom Selier 2024-02-03 13:12:57 +01:00
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\usepackage[a4paper, total={7in, 10in}]{geometry} \usepackage[a4paper, total={7in, 10in}]{geometry}
\usepackage{multicol} \usepackage{multicol}
\usepackage{lipsum} \usepackage{lipsum}
\usepackage{caption}
\usepackage{graphicx} \usepackage{graphicx}
\usepackage{enumitem}
\newenvironment{Figure}
{\par\medskip\noindent\minipage{\linewidth}}
{\endminipage\par\medskip}
\graphicspath{{images/}} \graphicspath{{images/}}
@ -24,26 +30,125 @@
\section{Introduction} \section{Introduction}
\lipsum[1-2] \lipsum[1-2]
\section{Circuit Description} \section{Circuit Description}
% Filler image, don't get attached
\begin{Figure}
\centering
\includegraphics[scale=0.38]{SCHEMATIC_FULL.png}
\captionof{figure}{WIP}
\label{fig:schematic_full}
\end{Figure}
\lipsum[3-4] \lipsum[3-4]
\section{Methodology} \section{Methodology}
To characterize the system, several tests have been performed. The To characterize the system, several tests have been performed. The
characteristics of interest are the following: characteristics of interest are the following:
\begin{enumerate} \begin{enumerate}[nosep]
\item Efficiency \item Efficiency
\item Noise \item Noise
\item Ripple characteristics \item Ripple characteristics
\item Transients \item Transients
\end{enumerate} \end{enumerate}
In this section a test or measurement will be described for each of the above
characteristics.
Each of these characteristics have been tested at two different output voltages Each of the characteristics have been tested at two different output voltages
and load currents. The different voltages are $7V$ and $3.3V$. The chosen load and various load currents. The different voltages are $7V$ and $3.3V$. The
currents are $10$, $20$, $30$, $40$ and $50 mA$. These values were chosen to chosen load currents are $10$, $20$, $30$, $40$ and $50 mA$. These values
give characterize the circuit over a broad range of conditions. were chosen to give characterize the circuit over a broad range of conditions.
\subsection{Efficiency}
\begin{Figure}
\centering
\includegraphics[scale=0.34]{SCHEMATIC_EFFICIENCY.png}
\captionof{figure}{WIP}
\label{fig:schematic_efficiency}
\end{Figure}
To measure the efficiency of the circuit, four measurements were taken.
A current and a voltage measurement were taken at the supply and load
respectively. The measurements were taken as shown in figure
\ref{fig:schematic_efficiency}. The energy used by the supply and the load
can be calculated using the equation \ref{eq:power}. Then, using equation
\ref{eq:efficiency}, efficiency can be calculated.
\begin{equation}
\label{eq:power}
P [W] = U[V] \cdot I[A]
\end{equation}
\begin{equation}
\label{eq:efficiency}
\eta[\%] = \frac{P_{load}[W]}{P_{supply}[W]} \cdot 100\%
\end{equation}
\subsection{Noise}
To measure the noice of the circuit an oscilloscope probe was placed on the
variable resistor in figure \ref{fig:schematic_full}. Over the period of 1
millisecond, 20,000 points were measured.
Noise has several metrics in which it can be quantized. Two metrics were
calculated, the standard devation (SD) and the peak to peak noise.
\subsubsection{Peak to peak}\label{section:peak_to_peak}
Peak to peak is the simplest way to look at noise. The signal has a stationary
mean over the period of 1 millisecond. Thus the highest measured value can be
subtracted from the lowest measured value.
\subsubsection{Standard Deviation}
The second metric used to measure noise was the standard deviation.
Unlike, peak to peak it givesa better impression of the noise over a longer
signal. SD can be calculated using equation \ref{eq:sd}.
\begin{equation}
\label{eq:sd}
\sigma = \sqrt{\frac{1}{N}\sum^{N-1}_{i=0}(x[i] - \mu)^2}
\end{equation}
Where $x[i]$ is each voltage measurement, $\mu$ is the mean of the signal and
$N$ is the total amount of samples.
\subsection{Ripple characteristics}
\begin{Figure}
\centering
\includegraphics[scale=0.5]{RIPPLE.png}
\captionof{figure}{WIP}
\label{fig:ripple}
\end{Figure}
A significant source of the noise was caused by a specific ripple, shown in
figure \ref{fig:ripple}.
This ripple coincided with the MOSFETs opening or closing.
To further characterize this behaviour a close up measurement was taken.
The oscilloscope was set to AC-coupling and the settigns were adjusted
for the ripple to be full screen. Then, two additional characteristics can
be calculated. The ripple's peak to peak voltage and the ripple's (most prevalent)
frequency. The peak to peak value can be calculated using the method described in
section \ref{section:peak_to_peak}.
To measure the frequency of the signal using an FFT, it had to be pre-processed
first using a Hamming window this eliminates sharp edges at the edge of the
measurement, causing unwanted frequencies to appear in the frequency domain.
\begin{equation}
\label{eq:hamming}
% 0.54 - 0.46 * cos(2*np.pi*(n/N))
w(i) = 0.54 - 0.46 \cdot cos \left(2 \pi \frac{i}{N} \right)
\end{equation}
Where $i$ is the current sample and $N$ is the total amount of samples. Each
sample in the signal can be multiplied by the corresponding value in the window,
preparing the signal for the FFT.
\subsection{Transients}
The last measurements were hocus pocus
\section{Results} \section{Results}
\lipsum[1-2]
\section{Conclusion} \section{Conclusion}
\lipsum[3-4]
\end{multicols} \end{multicols}
\end{document} \end{document}

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